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![Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials](https://pubs.acs.org/cms/10.1021/acsaelm.8b00071/asset/images/medium/el-2018-00071w_0006.gif)
Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials
![Foldable uniform GeOx/ZnO/C composite nanofibers as a high-capacity anode material for flexible lithium ion batteries - ScienceDirect Foldable uniform GeOx/ZnO/C composite nanofibers as a high-capacity anode material for flexible lithium ion batteries - ScienceDirect](https://ars.els-cdn.com/content/image/1-s2.0-S1385894718321247-ga1.jpg)
Foldable uniform GeOx/ZnO/C composite nanofibers as a high-capacity anode material for flexible lithium ion batteries - ScienceDirect
![Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials](https://pubs.acs.org/cms/10.1021/acsaelm.8b00071/asset/images/medium/el-2018-00071w_0003.gif)
Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials
![Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials](https://pubs.acs.org/cms/10.1021/acsaelm.8b00071/asset/images/medium/el-2018-00071w_0004.gif)
Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials
![Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation | Journal of Materials Science: Materials in Electronics Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation | Journal of Materials Science: Materials in Electronics](https://media.springernature.com/m685/springer-static/image/art%3A10.1007%2Fs10854-023-11334-5/MediaObjects/10854_2023_11334_Fig2_HTML.png)
Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation | Journal of Materials Science: Materials in Electronics
![Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation | Journal of Materials Science: Materials in Electronics Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation | Journal of Materials Science: Materials in Electronics](https://media.springernature.com/m685/springer-static/image/art%3A10.1007%2Fs10854-023-11334-5/MediaObjects/10854_2023_11334_Fig10_HTML.png)